Apparatus and method for detecting the temperature in a disk memory device

摘要

The apparatus and method for detecting the temperature in the disk memory device includes two voltage source dividing circuits. One of the voltage dividing circuits includes a first and second temperature independent resistances connected to the voltage source in series for providing a first electric potential from a connecting point located between the first and second resistances. The other voltage source dividing circuits includes a third temperature independent resistance and a temperature dependent resistance for detecting the temperature connected to the voltage source in series for providing a second electric potential from connecting point between the third temperature independent resistance and the temperature dependent resistance. The first and the second electric potentials are converted to an electric potential ratio. The temperature is acquired by referencing to a predetermined electric potential ratio-temperature characteristic based on the calculated electric potential ratio.