A METHOD FOR MEASURING COEFFICIENTS OF REFLECTION AND ABSORBTION BY CRYSTALS OF MODULATED LIGHT

摘要

Crystal-modulated light reflection and absorption ratio measurement mode attributes to the field of optics and may be used for differential spectroscopy. The aim of the invention is to increase the precision of crystal-modulated light reflection and absorption ratio measurement ratios. For this aim the crystal-modulated light reflection and absorption ratio measurement mode is used, when monochrome light is measured by the waves and by the intensity, commutated with the optical system of mirrors. As a result, the signals, proportional to the intensity of the incident and aliquot-passed light and the signals, proportional to the undulatory modulated incident and aliquot-passed light are received. All of these signals are converted into the signals, proportional to the crystal undulatory-modulated light reflection and absorption ratio by four memory elements, three changers, and two differential amplifiers.