发明名称 |
Method of fabricating compound semiconductor device and apparatus for fabricating compound semiconductor device |
摘要 |
A method of fabricating a compound semiconductor device having an ohmic electrode of a low contact potential and an apparatus for fabricating a compound semiconductor device are obtained. The method comprises a substrate cleaning step including a first cleaning step of heating a compound semiconductor substrate containing a first conductivity type impurity in a temperature range of not more than 250° C. for etching its surface with hydrogen chloride and a second cleaning step of performing a radical hydrotreatment on the compound semiconductor substrate etched with hydrogen chloride after the first cleaning step.
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申请公布号 |
US2001055887(A1) |
申请公布日期 |
2001.12.27 |
申请号 |
US20010818309 |
申请日期 |
2001.03.27 |
申请人 |
NAKAMURA TAKAO |
发明人 |
NAKAMURA TAKAO |
分类号 |
C30B29/48;H01L21/28;H01L21/302;H01L21/304;H01L21/3065;H01L33/00;H01L33/28;H01L33/40;(IPC1-7):H01L21/461 |
主分类号 |
C30B29/48 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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