发明名称 Method of fabricating compound semiconductor device and apparatus for fabricating compound semiconductor device
摘要 A method of fabricating a compound semiconductor device having an ohmic electrode of a low contact potential and an apparatus for fabricating a compound semiconductor device are obtained. The method comprises a substrate cleaning step including a first cleaning step of heating a compound semiconductor substrate containing a first conductivity type impurity in a temperature range of not more than 250° C. for etching its surface with hydrogen chloride and a second cleaning step of performing a radical hydrotreatment on the compound semiconductor substrate etched with hydrogen chloride after the first cleaning step.
申请公布号 US2001055887(A1) 申请公布日期 2001.12.27
申请号 US20010818309 申请日期 2001.03.27
申请人 NAKAMURA TAKAO 发明人 NAKAMURA TAKAO
分类号 C30B29/48;H01L21/28;H01L21/302;H01L21/304;H01L21/3065;H01L33/00;H01L33/28;H01L33/40;(IPC1-7):H01L21/461 主分类号 C30B29/48
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