发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE THEREOF
摘要 <p>A semiconductor device has the multilayer wiring structure that includes at least one insulating layer having a set of conducting parts of an area of 500 ñm<2> or greater and a width of 1.0 ñm or narrower. A method of manufacturing such a semiconductor device comprises a chemical and mechanical polishing step for smoothing the surface of the insulating layer (501), a washing step for washing the smoothed surface of the insulating layer with chemical solution (502), and a rinsing step for removing the chemical solution (503). The rinsing step uses water containing dissolved oxygen less than 6 ppm by weight.</p>
申请公布号 WO0199168(A1) 申请公布日期 2001.12.27
申请号 WO2000JP04164 申请日期 2000.06.23
申请人 FUJITSU LIMITED;HORIUCHI, HIROSHI;YAMAMOTO, TAMOTSU;TAKIGAWA, YUKIO;SUZUKI, SHIGERU;SANTO, NOBUAKI;MIYAJIMA, MOTOSHU 发明人 HORIUCHI, HIROSHI;YAMAMOTO, TAMOTSU;TAKIGAWA, YUKIO;SUZUKI, SHIGERU;SANTO, NOBUAKI;MIYAJIMA, MOTOSHU
分类号 H01L21/02;H01L21/321;H01L21/768;H01L23/532;(IPC1-7):H01L21/304;H01L21/320 主分类号 H01L21/02
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