| 摘要 |
PROBLEM TO BE SOLVED: To overcome the problem such that, related to a functional test for an A/D converter in a semiconductor integrated circuit, testing of a fast A/D converter at an actual operation speed is difficult because wiring delay in the semiconductor integrated circuit from the output of A/D converter to the input of a tester affects much. SOLUTION: There are provided a RAM in the semiconductor integrated circuit, a write/read control means which controls writing/reading with the RAM, and a first selecting means which selects the digital output of the A/D converter or the output of a logic circuit and takes it as a write data into the RAM.
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