发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device for mounting a reference voltage generation circuit for performing tuning without changing the circuit when process conditions fluctuate. SOLUTION: This semiconductor integrated circuit device is provided with a voltage drop circuit for supplying a control signal for switching switches MSW1 and /MSW1 being formed by a test mode for tuning from a switch control circuit to the reference voltage generation circuit that is configured so that two circuit configurations with different temperature characteristics are switched by the switches MSW1 and /MSW1, and tuning is made by the switching of switches SW1-SW4, and then supplying a control signal by cutting off the fuse of the switch control circuit, and outputting a reference voltage Vref using a reference voltage generation circuit.</p> |
申请公布号 |
JP2001358299(A) |
申请公布日期 |
2001.12.26 |
申请号 |
JP20000174712 |
申请日期 |
2000.06.12 |
申请人 |
MITSUBISHI ELECTRIC CORP;MITSUBISHI ELECTRIC ENGINEERING CO LTD |
发明人 |
KOBAYASHI MASAKO;MORISHITA GEN;AKIYAMA MIHOKO;TATEWAKI YASUHIKO;YAMAZAKI AKIRA;FUJII NOBUYUKI |
分类号 |
G06F1/26;G05F1/46;G05F3/24;G06F1/32;H01L21/822;H01L27/04;(IPC1-7):H01L27/04 |
主分类号 |
G06F1/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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