发明名称 |
METHOD FOR PERFORMING ANISOTROPIC PLASMA ETCHING USING FLUOROCHEMICAL SUBSTANCE THAT IS NON- CHLOROFLUOROCARBON |
摘要 |
PROBLEM TO BE SOLVED: To provide a method by which an object to be etched can be readily dry-etched with high dimensional accuracy by reducing the readhering quantity of etch residues or removing the etching generated substance at dry etching. SOLUTION: This method of removing a metal from the selected regions of a substrate includes a step of causing the metal to deposit on the substrate, a step of exposing the selected metallic region by forming and patterning a mask, and a step of exposing the metal to a fluorine-containing plasma. The method also includes a step of heating the metal to a temperature, at which a volatile metal-fluorine compound is produced and a step of discharging the metal-fluorine compound.
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申请公布号 |
JP2001358133(A) |
申请公布日期 |
2001.12.26 |
申请号 |
JP20010156182 |
申请日期 |
2001.05.24 |
申请人 |
SHARP CORP |
发明人 |
MAA JER-SHEN;ZHANG FENGYAN |
分类号 |
C23F4/00;H01L21/302;H01L21/3065;H01L21/3213;(IPC1-7):H01L21/306 |
主分类号 |
C23F4/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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