发明名称 Device and method for detecting and preventing arcing in RF plasma systems
摘要 A system and method for detecting and preventing arcing in plasma processing systems. Arcing is detected and characterized by measuring and analyzing electrical signals from a circuit coupled to the plasma. After characterization, the electrical signals can then be correlated with arcing events occurring during a processing run. Information can be obtained regarding location, severity, and frequency of arcing events. The system and method better diagnose the causes of arcing and provide improved protection against undesirable arcing, which can cause damage to the system and the workpiece.
申请公布号 US6332961(B1) 申请公布日期 2001.12.25
申请号 US20000508102 申请日期 2000.06.02
申请人 TOKYO ELECTRON LIMITED 发明人 JOHNSON WAYNE L.;PARSONS RICHARD
分类号 H05H1/46;C23C14/54;H01J37/32;H01L21/205;H01L21/302;H01L21/3065;(IPC1-7):C23C14/34;G01R23/00 主分类号 H05H1/46
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