发明名称 Semiconductor memory device permitting improved integration density and reduced accessing time
摘要 A sub-amplifier includes first and second transistors which each receive the potential of a sub-I/O line pair at each gate, a third transistor controlled by a signal transmitted in the memory cell column-direction and coupling the sources of the first and second transistors and a ground potential, and fourth and fifth transistors controlled by a signal transmitted in the memory cell row-direction and coupling the drains of the first and second transistors and a main I/O line pair. Since the sub-amplifier is controlled by a signal transmitted in the column-direction, the influence of skew with a column selecting signal can be reduced.
申请公布号 US6333884(B1) 申请公布日期 2001.12.25
申请号 US19990311560 申请日期 1999.05.14
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 KATO HIROSHI;OOISHI TSUKASA;HIDAKA HIDETO
分类号 G11C11/41;G11C5/02;G11C5/06;G11C7/06;G11C7/10;G11C7/18;G11C11/401;G11C11/409;G11C11/419;(IPC1-7):G11C7/02 主分类号 G11C11/41
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