发明名称 Semiconductor device manufacturing method using electrostatic chuck and semiconductor device manufacturing system
摘要 A semiconductor device manufacturing method comprises the steps of placing a substrate to be processed on an electrostatic chuck on a substrate stand in a process chamber, and applying a negative voltage to the electrostatic chuck. After applying the negative voltage, the substrate is stuck onto the electrostatic chuck, a process gas is introduced into the process chamber, discharge plasma is generated, and the substrate is processed as predetermined.
申请公布号 US6333246(B1) 申请公布日期 2001.12.25
申请号 US20000604722 申请日期 2000.06.28
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 NARITA MASAKI;YOSHIDA YUKIMASA;AOKI KATSUAKI;FUJITA HIROSHI;YAMAZAKI OSAMU;OMINE TOSHIMITSU;MATSUI ISAO;O TAKASHI
分类号 H01L21/302;C23C16/44;C23C16/50;H01L21/205;H01L21/3065;H01L21/311;H01L21/683;(IPC1-7):H01L21/20 主分类号 H01L21/302
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