发明名称 STACKED TYPE POLISHING PAD
摘要 PROBLEM TO BE SOLVED: To provide a stacked type wafer polishing pad capable of changing its hardness. SOLUTION: A polishing pad assembly to be used in a chemical machinery polishing device having a polishing platen is provided. This polishing pad assembly includes a first pad disposed on the platen. The first pad is provided with a sealable enclosure having a flexible skin in which porous material is partially filled. A control mechanism is adapted to inject fluid into the enclosure, and extract fluid from the enclosure. Hardness of the first pad is changed in accordance with quantity of fluid in the enclosure. A second pad is disposed on the first pad.
申请公布号 JP2001353656(A) 申请公布日期 2001.12.25
申请号 JP20010127185 申请日期 2001.04.25
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 CHEN SHYNG-TSONG;MICHAEL F ROFARO;SMITH WOODY RAY
分类号 B24B37/22;B24B37/24;B24B49/08;B24D13/20;H01L21/304 主分类号 B24B37/22
代理机构 代理人
主权项
地址