发明名称 Non-destructive inspection apparatus and inspection system using it
摘要 A non-destructive inspection apparatus has a radiation source, a radiation detector, a radiation source diver, a detector driver, a drive controller, a delay circuit, a radiation signal processing circuit, a memory, a computer, a display device, and an input device. The radiation detector consists of one-dimensional or two-dimensional array of detectors having a long collimator whose pores are in parallel with the radiation angle of the radiation emitted in an angular pattern from the radiation source, whereby a transmission image of a large size structure can be obtained at high speed and with a high resolution. Furthermore, the detect position in an inspection object can be specified by analyzing a plurality of specified transmission images using the inspection apparatus.
申请公布号 US6333962(B1) 申请公布日期 2001.12.25
申请号 US19990326598 申请日期 1999.06.07
申请人 HITACHI, LTD. 发明人 KITAGUCHI HIROSHI;IZUMI SHIGERU;MIYAI HIROSHI;SATO KATSUTOSHI;AOKI YASUKO;HATTORI YUKIYA
分类号 G01N23/04;(IPC1-7):G01T1/00 主分类号 G01N23/04
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