发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor device for effectively injecting indium into a process for mounting different gate insulating film thicknesses. SOLUTION: This manufacturing method of a semiconductor device for mounting a plurality of different gate insulating film thicknesses and at the same time, forming an N-channel region using indium at a specific region of a MOSFET includes a process for forming a P-well region and a first N-channel region, consisting of constituents other than indium, a process for forming a first gate insulating fil, a process for removing the first gate insulating film at a prescribed region other than the first N-channel region, a process for forming the P-well region, in a region where the first gate insulating film has been removed, and a second N-channel region containing indium, and a process for forming a second gate insulating film on the surface of the second N-channel region.
申请公布号 JP2001351987(A) 申请公布日期 2001.12.21
申请号 JP20000174075 申请日期 2000.06.09
申请人 NEC CORP 发明人 FUKASAKU KATSUHIKO;ONO ATSUKI
分类号 H01L29/78;H01L21/316;H01L21/8234;H01L21/8244;H01L27/088;H01L27/11 主分类号 H01L29/78
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