发明名称 DISK-INSPECTING METHOD, DISK-INSPECTING DEVICE, CONTROL PROGRAM FOR THE DISK-INSPECTING DEVICE AND STORAGE MEDIUM WITH CONTROL PROGRAM OF DISK INSPECTING DEVICE STORED THEREIN
摘要 PROBLEM TO BE SOLVED: To provide a disk inspecting method which enables precise measurement of the film thickness of a pigment layer formed on a CD-R disk. SOLUTION: The CD-R disk 14 is irradiated with a laser beam 8, and the transmitted laser beam 8 is converted into an electrical signal by a photodetector 10. Subsequently, the film thickness of the pigment layer is calculated from the electrical signal, based on a relational expression which shows the relation between the electrical signal and the film thickness of the pigment layer, and the quantity as to whether the CD-R disk 14 is nondefective is determined. Thus, until the inspection of the CD-R disk 14 to be subsequently inspected is started, after the completion of the inspection of the CD-R disk 14, the photodetector 10 is directly irradiated with the laser beam 8, and the relational expression is calibrated in accordance with the electrical signal thus gained.
申请公布号 JP2001351274(A) 申请公布日期 2001.12.21
申请号 JP20000174652 申请日期 2000.06.12
申请人 TDK CORP 发明人 OKAMOTO TOSHIHIKO
分类号 G01B11/06;G11B7/26;(IPC1-7):G11B7/26 主分类号 G01B11/06
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