发明名称 LASER DIODE FAILURE DETECTION CIRCUIT
摘要 PROBLEM TO BE SOLVED: To solve the problem that the logic of a failure detection circuit output terminal does not change as far as a CELL signal input terminal does not change to a low level when an LD(laser diode) emits light once in a circuit for detecting the failed state of the LD that is driven by a conventional burst signal, and hence a non-emitted state cannot be detected even if the LD fails in the middle of the burst signal. SOLUTION: The light signal of a laser diode 1 and the drive current of the laser diode are used to detect a logic, thus detecting the failure in the laser diode within the burst signal. Then, even if the non-emitted state of a laser diode light signal continues for fixed time, failure cannot be detected erroneously.
申请公布号 JP2001352122(A) 申请公布日期 2001.12.21
申请号 JP20000174250 申请日期 2000.06.09
申请人 NEC MIYAGI LTD 发明人 OTSUKA YASUHIRO
分类号 H01S5/00;H01S5/02;H04B10/07;H04B10/079;H04B17/00 主分类号 H01S5/00
代理机构 代理人
主权项
地址