发明名称 THREE-DIMENSIONAL MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To suppress nonconformity caused by halation or the like, and to improve measurement precision, when measuring the three-dimensional shape of a measuring object by using a phase shift method. SOLUTION: A printing state inspection device 1 is equipped with a table 2 for loading thereon a printed circuit board K on which a cream solder C is printed, an illumination device 3 for irradiating the surface of the printed circuit board K from the oblique upside with plural sinusoidal optical patterns having changing phases, and a CCD camera 4 forming an imaging means for imaging the irradiated part on the printed circuit board K. The illumination device 3 is arranged on a straight line joining the center of the table 2 to a corner part, and irradiates the optical patterns from the direction inclined by 45 degrees with plane view against the side direction of the printed circuit board K. Therefore, the striped optical patterns having illuminance changing sinusoidally along a line inclined by 45 degrees against the extending direction of the cream solder C are irradiated.
申请公布号 JP2001349710(A) 申请公布日期 2001.12.21
申请号 JP20000171729 申请日期 2000.06.08
申请人 CKD CORP 发明人 ARIMA NAOHIRO;TAKAGI KENZO
分类号 G01B11/02;G01B11/24;G01B11/25;G06T1/00;H05K3/34;(IPC1-7):G01B11/24 主分类号 G01B11/02
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