发明名称 PTP PREPARATION INSPECTING DEVICE AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide an inspecting device and method capable of clearly capturing chips in tablets, missing, powder catching failures, and failures in mesh- shaped protruded parts in PTP preparation. SOLUTION: The PTP preparation inspecting device includes a light source 2 arranged in front of a packaged article 1, a linearly polarizing filter 3 on the side of incident light arranged between the light source 2 and packaged article 1, so that the light from the light source 2 turns unto a linearly polarized light in a prescribed direction, a camera 5 to pick up the image of the packaged article 1, and a linearly polarizing filter 6 on the side of light reception, arranged between the packaged article 1 and camera 5, so as to interrupt the linearly polarized light which is reflected regularly at a sheet member 7 and film 8.
申请公布号 JP2001349837(A) 申请公布日期 2001.12.21
申请号 JP20000175027 申请日期 2000.06.12
申请人 KIRIN TECHNO-SYSTEM CORP 发明人 TOTSUKA HIROYUKI
分类号 G01N21/85;G01N21/21;G01N21/95;G02B27/28;H01L31/0232;H01L31/12;H01L33/60 主分类号 G01N21/85
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