| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor testing system capable of detecting a minute waveform contained in the input and output waveforms of a semiconductor device. SOLUTION: This semiconductor testing system is provided with a semiconductor testing device 1, a control device 2, and a memory device 3. The semiconductor testing device 1 performs a test to a semiconductor device 11a. A capture part 20 within the control device 2 sets the timing of sampling conformed to the sampling point number contained in an inputted control data. Since the sampling interval within each test cycle is shortened by setting this sampling point number to a large value, a glitch can be detected. Since the sampling point number can be set to a different value every cycle, the necessity of setting a number of sampling point numbers for all cycles to perform the test is dispensed with even in a case such that the sampling point number is increased only for a specified test cycle to collect data, and the time required for glitch detection can be shortened. |
