发明名称 CHARGED PARTICLE BEAM EXPOSURE DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a charged particle beam exposure device which is free from fluctuation of magnetic field on an optical axis even when a magnet track movement type linear motor is used. SOLUTION: A coil 4 which is bared in accordance with a position of a magnet track 5 is generated. A prescribed magnetic field is formed by making a prescribed current flow to a prescribed coil among the bared coils 4. Then, a magnetic field from the coil acts on an optical axis as shown by a magnetic force line 7. Meanwhile, a magnetic field generated by a permanent magnet of the magnet track 5 acts on an optical axis as shown by a magnetic force line 6 and finally the sum of magnetic field shown by magnetic force lines 6, 7 functions on an optical axis. If the sum of magnetic field shown by the magnetic force lines 6, 7 is made fixed regardless of a position of the magnet track 5 by adjusting a current to be made to flow to the bared coil 4, a magnetic field on an optical axis does not vary due to movement of the magnet track 5.
申请公布号 JP2001351838(A) 申请公布日期 2001.12.21
申请号 JP20000167435 申请日期 2000.06.05
申请人 NIKON CORP 发明人 NAKANO KATSUSHI
分类号 G03F7/20;H01J37/20;H01J37/305;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/20
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