发明名称 SEMICONDUCTOR MANUFACTURING DEVICE AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor manufacturing device and method, capable of lowering processing temperature, restraining discharging of metals from affecting a substrate, and efficiently carrying out formation of a film, a pretreatment, and a post-treatment. SOLUTION: A semiconductor manufacturing device is equipped with a reaction chamber 1 for subjecting a substrate 8 to prescribed processing, holding it horizontal in position, a heater 3 heating the substrate 8, gas feed openings 10A and 10B which are provided confronting each other through the intermediary of the surface of the substrate 8 to form a flow of gas nearly in parallel with the surface of the substrate 8, and gas exhaust vents 11A and 11B. Discharge coils 12A and 12B are provided as a plasma source above the flow of gas inside the reaction chamber 1, and active seeds generated by the plasma sources are fed nearly in parallel with the substrate 8 and made to flow a prescribed number of times, varied in the direction of the flow.
申请公布号 JP2001351908(A) 申请公布日期 2001.12.21
申请号 JP20000168483 申请日期 2000.06.06
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 TOYODA KAZUYUKI;SHIMA NOBUHITO;KASAHARA OSAMU;TANAKA TSUTOMU
分类号 C23C16/40;C23C16/56;H01L21/31;H01L21/318;(IPC1-7):H01L21/31 主分类号 C23C16/40
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