发明名称 INSPECTION DEVICE FOR SCATTERING RAY REMOVING AIR GRID
摘要 PROBLEM TO BE SOLVED: To simply conduct the inspection of a scattering ray removing air grid. SOLUTION: An air grid 10 is supported by a support means 3, and inspection light 2A from a point light source 2 at a focusing position of a strip 12 constituting the air grid 10, namely, at a position corresponding to a position of a radiation source when the air grid 10 is used is emitted to irradiate the inspection light 2A on the air grid 10. Transmitted light 2B transmitting the air grid 10 is detected by line sensors 4A to 4C to obtain inspection signals S1 to S3 representing the transmitted light 2B. Profiles of the inspection signals S1 to S3 are analyzed by an analysis means 5, and the result of inspection is displayed in a display means 6.
申请公布号 JP2001349953(A) 申请公布日期 2001.12.21
申请号 JP20000175271 申请日期 2000.06.12
申请人 FUJI PHOTO FILM CO LTD 发明人 OGAWA EIJI
分类号 G01B11/24;G01B11/245;G01T7/00;(IPC1-7):G01T7/00 主分类号 G01B11/24
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