发明名称 METHOD OF FORMING SILICON OXIDE FILM
摘要 PROBLEM TO BE SOLVED: To provide a silicon oxide film which is reduced in permittivity. SOLUTION: A silicon oxide film, that contains oxides having a small free energy at an optional temperature as impurities, is formed, and only the oxides contained in the silicon oxide film are selectively removed through reduction, to form voids inside the silicon oxide film.
申请公布号 JP2001351916(A) 申请公布日期 2001.12.21
申请号 JP20000170138 申请日期 2000.06.07
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 IKURA TSUNEO
分类号 C23C16/40;C23C16/56;H01L21/316;(IPC1-7):H01L21/316 主分类号 C23C16/40
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