发明名称 |
ABRASIVE FOR SEMICONDUCTOR INSULATION FILM |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a high-quality abrasive for insulation film of a semiconductor which can increase a polishing speed while at the same time reducing scratches and dust when polishing an insulation film of a semiconductor by CMP method. SOLUTION: The abrasive for an insulation layer of a semiconductor consists of a slurry prepared by dispersing composite oxide particles of cerium and zirconium into an aqueous solution.</p> |
申请公布号 |
JP2001351883(A) |
申请公布日期 |
2001.12.21 |
申请号 |
JP20000169005 |
申请日期 |
2000.06.06 |
申请人 |
TORAY IND INC |
发明人 |
GOTO SHOICHIRO;EDOGAWA KATSUYA;TSURUMI TORU |
分类号 |
B24B37/00;C09K3/14;H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
B24B37/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|