发明名称 SILICON FILM AND ITS FORMING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide a method for easily forming a silicon film which can form an element, having an optical forbidden band width controlled to a low level, exhibiting high light sensitivity and high light-fastness deterioration by absorbing visible light effectively and exhibiting high energy conversion efficiency, when it is applied to a photovoltaic element. SOLUTION: A reaction gas, containing a silane-based compound having a halogen atom, e.g. dichlorosilane, in which the ratio of the number of halogen atoms and hydrogen atoms (number of halogen atoms/number of hydrogen atoms) existing in the reaction gas is in the range of 0.002-50 is fed into a reaction chamber sustained in vacuum state. High-frequency power is then applied to a high-frequency applying coil disposed in the reaction chamber of an the outside thereof in order to generate reaction gas plasma, thus forming a silicon film on the surface of a backing material disposed in the reaction chamber and heated at 150-550 deg.C. A silicon film, containing 0.005-5 atm.% of halogen atom, 0.01-15 atm.% of hydrogen atom and having an optical forbidden band width of 1.55-1.75 eV is thereby obtained.</p>
申请公布号 JP2001352087(A) 申请公布日期 2001.12.21
申请号 JP20000170378 申请日期 2000.06.07
申请人 TOKUYAMA CORP 发明人 AZUMA MASANOBU;TOFUTEII JURAITEII
分类号 C23C16/24;H01L21/205;H01L31/04;(IPC1-7):H01L31/04 主分类号 C23C16/24
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