发明名称 ULTRASONIC PROBE, AND SYSTEM AND METHOD FOR ULTRASONIC FLAW INSPECTION
摘要 <p>PROBLEM TO BE SOLVED: To precisely obtain the position of an ultrasonic probe lying on a specimen material. SOLUTION: The ultrasound probe 3 is provided with a vibrator 14, which transmits and receives ultrasonic waves with reference to the specimen material 1, an optical position detector 15 which comprises an optical sensor 23 for reading patterns on the opposite face 17 of the specimen material 1 with a fixed period and which detects own present position on the specimen material on the basis of a movement amount from the same patterns which is read out at an immediately preceding cycle of the patterns read out by the optical sensor 23 at an arbitrary cycle and a container 13, which houses the vibrator 14 and the optical position detector 15.</p>
申请公布号 JP2001349878(A) 申请公布日期 2001.12.21
申请号 JP20000172523 申请日期 2000.06.08
申请人 JAPAN PROBE KK 发明人 HOSHINO MITSUHIRO;TAKAHASHI OSAMU
分类号 G01B11/00;G01B17/00;G01N29/04;G01N29/24;(IPC1-7):G01N29/24;G01N29/10 主分类号 G01B11/00
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