发明名称 INFRARED DETECTING ELEMENT AND THERMOMETER
摘要 PROBLEM TO BE SOLVED: To provide an infrared detecting element capable of improving the precision of temperature measurement while reducing the size and cost by the application of a thermopile form. SOLUTION: This infrared detecting element comprises a semiconductor substrate, a thermopile formed on the main surface of the semiconductor substrate to generate a voltage on the basis of the temperature of a heat absorber for receiving infrared ray, and a reference temperature detecting means for detecting the reference temperature of the thermopile. The thermosensitive part of the reference temperature detecting means is integrally formed within the semiconductor structure having the thermopile formed therein.
申请公布号 JP2001349787(A) 申请公布日期 2001.12.21
申请号 JP20000169693 申请日期 2000.06.06
申请人 SEIKO EPSON CORP 发明人 SATO SHIGEMI;IWAMOTO OSAMU;SHIOBARA YASUHIRO;ODA YUJI
分类号 G01J1/02;A61B5/01;G01J5/00;G01J5/02;G01J5/04;G01J5/08;G01J5/10;G01J5/12;G01J5/16;G01K13/00;(IPC1-7):G01J5/16;A61B5/00 主分类号 G01J1/02
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