发明名称 METHOD AND DEVICE FOR MEASURING IMPEDANCE
摘要 PROBLEM TO BE SOLVED: To provide an impedance measuring method for measuring the impedance of a large number of circuit boards in a short time with excellent accuracy. SOLUTION: The end face 61 of a circuit board 3 is set at a predetermined position. After a probe A is moved so as to face the end face 61 of the circuit board 3, the probe A is brought into contact with a test pattern 62 exposed to the end face 61 of the circuit board 3. The impedance of the test pattern 62 is measured by a measuring instrument connected to the probe A. The probe A can be easily brought into contact with the very small test pattern 62 exposed to the end face 61 of the circuit board 3, and the impedance can be easily measured.
申请公布号 JP2001349912(A) 申请公布日期 2001.12.21
申请号 JP20000169570 申请日期 2000.06.06
申请人 MATSUSHITA ELECTRIC WORKS LTD 发明人 NAKASHIBA TORU;MATSUSHITA YUKIO;IWAISHI TATSUMI;TAKETOMI MASANOBU;NAGASO MITSUHIDE;AKAMATSU TOSHIYUKI
分类号 G01R1/06;G01R27/02;G01R31/02;G01R31/28;H05K3/46;(IPC1-7):G01R27/02 主分类号 G01R1/06
代理机构 代理人
主权项
地址