发明名称 |
Semiconductor pressure sensor having strain gauge and circuit portion on semiconductor substrate |
摘要 |
A semiconductor pressure sensor includes a SOI substrate composed of first and second silicon substrates. A diaphragm portion is formed by the first silicon substrate as a bottom of a recess portion formed in the second silicon substrate. Strain gauges are formed on the diaphragm portion, and a circuit portion is formed on the first silicon substrate at a region other than the diaphragm portion. ALOCOS film for isolating the strain gauges from the circuit portion is formed on the first silicon substrate outside the outermost peripheral portion of the diaphragm portion.
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申请公布号 |
US2001052628(A1) |
申请公布日期 |
2001.12.20 |
申请号 |
US20010866752 |
申请日期 |
2001.05.30 |
申请人 |
ISHIO SEIICHIRO;TOYODA INAO;HAMAMOTO KAZUAKI;SUZUKI YASUTOSHI |
发明人 |
ISHIO SEIICHIRO;TOYODA INAO;HAMAMOTO KAZUAKI;SUZUKI YASUTOSHI |
分类号 |
G01L9/04;B81B3/00;B81B7/02;B81C1/00;G01L9/00;G01L9/06;H01L21/84;H01L27/12;H01L29/84;(IPC1-7):H01L29/82 |
主分类号 |
G01L9/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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