发明名称 HIGH-K GATE DIELECTRIC PROCESS WITH SELF ALIGNED DAMASCENE CONTACT TO DAMASCENE GATE AND A LOW-K INTER LEVEL DIELECTRIC
摘要 A method of fabricating a transistor having shallow source and drain extensions utilizes a self-aligned contact. The drain extensions are provided through an opening between a contact area and the gate structure. A high-K gate dielectric material can be utilized. P-MOS and N-MOS transistors can be created according to the disclosed method.
申请公布号 US2001053594(A1) 申请公布日期 2001.12.20
申请号 US19990304129 申请日期 1999.05.03
申请人 XIANG QI;BUYNOSKI MATTHEW S.;LIN MING-REN 发明人 XIANG QI;BUYNOSKI MATTHEW S.;LIN MING-REN
分类号 H01L21/28;H01L21/316;H01L21/336;H01L21/60;H01L21/8238;H01L29/51;(IPC1-7):H01L21/320;H01L21/476 主分类号 H01L21/28
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