发明名称 |
DOUBLE RECESSED TRANSISTOR |
摘要 |
A transistor structure is provided. This structure has a source electrode (12) and a drain electrode (14). A doped cap layer (16) of GaxIn1xAs is disposed below the source electrode (12) and the drain electrode (14) and provides a cap layer opening. An undoped resistive layer (18) of GaxIn1-xAs is disposed below the cap layer (16) and defines a resistive layer opening in registration with the cap layer opening and having a first width. A Schottky layer (20) of AlyIn1-yAs is disposed below the resistive layer (18). An undoped channel layer (28) is disposed below the Schottky layer (20). A semi-insulating substrate (36) is disposed below the channel layer (28). A top surface of the Schottky layer (20) beneath the resistive layer opening provides a recess having a second width smaller than the first width. A gate electrode (22) is in contact with a bottom surface of the recess provided by the Schottky layer (20).
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申请公布号 |
WO0161733(A3) |
申请公布日期 |
2001.12.20 |
申请号 |
WO2001US03563 |
申请日期 |
2001.02.02 |
申请人 |
RAYTHEON COMPANY |
发明人 |
HOKE, WILLIAM, E.;HUR, KATERINA, Y. |
分类号 |
H01L21/285;H01L21/316;H01L21/335;H01L29/778;(IPC1-7):H01L21/335 |
主分类号 |
H01L21/285 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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