Sorting control method of tested electric device

摘要

A sorting control method of tested ICs for sorting and reloading tested ICs held on a test tray to customer trays in accordance with test results, wherein a calculating from the test results an occurrence rate of each category of tested ICs held on the test tray and starting reloading from ICs of a category having a low occurrence rate and when a second tray for holding ICs of the category is being changed, reloading of ICs of a category having a high occurrence rate is performed.