发明名称 Method for etching an electrode in a semiconductor device
摘要 <p>A photo-resist having a predetermined pattern is formed on a top surface of a Pt layer. Next, the Pt layer is dry-etched by using a mixture of Cl2 and Ar as an etching gas. In this case, etching by-products are deposited on both side surfaces of the photo-resist and the Pt layer is shaped into an electrode. Then, the photo-resist which has become unnecessary after the Pt layer is dry etched is ashed and stripped by oxygen plasma. A Si substrate on which the etching by-products are deposited is soaked in a mixing solution composed of acetoacetylacetone, ammonia and DI water. The etching by-products are easily dissolved and removed. &lt;IMAGE&gt; &lt;IMAGE&gt; &lt;IMAGE&gt; &lt;IMAGE&gt;</p>
申请公布号 EP1164633(A2) 申请公布日期 2001.12.19
申请号 EP20010112920 申请日期 2001.06.05
申请人 NEC CORPORATION 发明人 TOKASHIKI, KEN
分类号 H01L21/302;H01L21/02;H01L21/304;H01L21/306;H01L21/3065;H01L21/3213;H01L21/8242;H01L21/8246;H01L27/105;H01L27/108;(IPC1-7):H01L21/321;H01L21/28 主分类号 H01L21/302
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