| 摘要 |
PCT No. PCT/AU95/00093 Sec. 371 Date Aug. 26, 1996 Sec. 102(e) Date Aug. 26, 1996 PCT Filed Feb. 24, 1995 PCT Pub. No. WO95/23462 PCT Pub. Date Aug. 31, 1995The present invention provides a method and apparatus for evaluating the performance of a signal-processing device during a test period when an input signal is applied to the signal-processing device and an output signal is generated by it. A select profile of the input (or output) signal quality is derived at intervals in which the output (or input) signal lies within some predetermined range. The derived profile may be normalized with respect to the quality of the input (or output) signal throughout the test period. The profile is indicative of device performance of the device being tested. The method may be implemented in either hardware or software. |
