| 摘要 |
PROBLEM TO BE SOLVED: To rapidly and surely provide a boundary scanning circuit, capable of inspecting the mounting or connection failures of a plurality of the integrated circuit devices on a substrate circuit, without having to form complicated circuit configuration. SOLUTION: Test data input(TDI signal), supplied from an external inspection apparatus (not shown), is respectively inputted to the TDI terminals of integrated circuit devices 1, 2, 3 in parallel. A selector 5 selects the TDO(test data output) signal of the integrated circuit device to be inspected from among the test data (TDO signals), outputted from the TDO terminals of the integrated circuit devices 1, 2, 3 corresponding to the selection signal Ss supplied from the external inspection apparatus, to send the same to the external inspection apparatus.
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