发明名称 TESTING CIRCUIT OF ANALOG-TO-DIGITAL CONVERTER AND ITS TESTING METHOD
摘要 PROBLEM TO BE SOLVED: To determine a non-defective product by simplifying an operation confirmation to test an analog-to-digital converter, and externally variable changing a comparison accuracy to meet a circumferential condition at inspection. SOLUTION: An analog-to-digital converter inspecting circuit 14 for checking an operation/non-operation is connected to the analog-to-digital converter 1 as a reference. Further, a comparator 12 for comparing converted value of an analog-to-digital converter 2 to be decided for its non-defectiveness or defectiveness with that of the converter 1 is provided, and the non-defectiveness or defectiveness of the converter 2 is decided according to an allowable error input 9.
申请公布号 JP2001345699(A) 申请公布日期 2001.12.14
申请号 JP20000166223 申请日期 2000.06.02
申请人 NEC MICROSYSTEMS LTD 发明人 INOUE KAZUHIKO
分类号 G01R31/316;G01R31/28;H03M1/10;(IPC1-7):H03M1/10 主分类号 G01R31/316
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