发明名称 METHOD AND APPARATUS FOR CHEMICAL MECHANICAL POLISHING
摘要 PROBLEM TO BE SOLVED: To provide a method and an apparatus for chemical mechanical polishing in which polishing time is shortened. SOLUTION: The chemical mechanical polishing method comprises a step for removing a film deposited on a substrate entirely or partially by etching, and a step for polishing the substrate chemically and mechanically following to the etching step. The etching step may comprise a step for turning the substrate and liquid for etching the film is typically fed continuously onto the surface of the rotating substrate.
申请公布号 JP2001345293(A) 申请公布日期 2001.12.14
申请号 JP20000162174 申请日期 2000.05.31
申请人 EBARA CORP 发明人 KATAKABE ICHIRO
分类号 H01L21/306;H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/306
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