发明名称 |
SEMICONDUCTOR-MANUFACTURING DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To accurately measure temperature by a thermocouple. SOLUTION: In this semiconductor-manufacturing device, a wafer W is placed on a susceptor 4 that is provided in a reaction pipe 1, and is heated by upper and lower lamps 2 and 3 for carrying out a predetermined treatment, and at the same time temperature near the wafer W is measured by a thermocouple 20 where a temperature-sensing contact is provided near the susceptor 4. In this case, a light shielding cover 30 for shielding direct light from the lower lamp 3 is provided in the temperature-sensing contact of the thermocouple 20.
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申请公布号 |
JP2001345269(A) |
申请公布日期 |
2001.12.14 |
申请号 |
JP20000162251 |
申请日期 |
2000.05.31 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
OSUMI NAOTO;KAKIZAKI SATOSHI;SHIMADA SHINICHI |
分类号 |
C23C16/48;H01L21/205;H01L21/22;H01L21/26;(IPC1-7):H01L21/205 |
主分类号 |
C23C16/48 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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