发明名称 |
CRYSTAL GRAIN MEASURING METHOD AND DEVICE FOR METAL SHEET |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a measuring method and a device for the crystal grain size of a metal sheet capable of measuring the crystal grain size quickly without reducing measurement precision even in the case where the thickness of a test body is thin. SOLUTION: A waveform from a wide-band waveform generation means 2 is given to an electromagnetic ultrasonic sensor 5, and the received wave is inputted into a frequency analytical means 8 to obtain a spectrum. The spectrum obtained by the frequency analytical means 8 is transmitted to a waveform operation processing means 9 to obtain an attenuation coefficientαin a resonance frequency. A crystal grain size calculation means 10 calculates the crystal grain size based on the attenuation coefficient in the resonance frequency obtained by the waveform processing means 9.</p> |
申请公布号 |
JP2001343366(A) |
申请公布日期 |
2001.12.14 |
申请号 |
JP20000165370 |
申请日期 |
2000.06.02 |
申请人 |
NKK CORP |
发明人 |
HASHIMOTO TATSUYA;IIZUKA YUKIMICHI |
分类号 |
G01N29/04;G01N29/12;(IPC1-7):G01N29/10 |
主分类号 |
G01N29/04 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|