发明名称 CRYSTAL GRAIN MEASURING METHOD AND DEVICE FOR METAL SHEET
摘要 <p>PROBLEM TO BE SOLVED: To provide a measuring method and a device for the crystal grain size of a metal sheet capable of measuring the crystal grain size quickly without reducing measurement precision even in the case where the thickness of a test body is thin. SOLUTION: A waveform from a wide-band waveform generation means 2 is given to an electromagnetic ultrasonic sensor 5, and the received wave is inputted into a frequency analytical means 8 to obtain a spectrum. The spectrum obtained by the frequency analytical means 8 is transmitted to a waveform operation processing means 9 to obtain an attenuation coefficientαin a resonance frequency. A crystal grain size calculation means 10 calculates the crystal grain size based on the attenuation coefficient in the resonance frequency obtained by the waveform processing means 9.</p>
申请公布号 JP2001343366(A) 申请公布日期 2001.12.14
申请号 JP20000165370 申请日期 2000.06.02
申请人 NKK CORP 发明人 HASHIMOTO TATSUYA;IIZUKA YUKIMICHI
分类号 G01N29/04;G01N29/12;(IPC1-7):G01N29/10 主分类号 G01N29/04
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