| 摘要 |
PROBLEM TO BE SOLVED: To provide an electric field probe which enables measurement of an electric field with a higher spatial resolving power and achieves a smaller structure by using an optoelectronic crystal. SOLUTION: Optoelectronic crystal 1x, 1y, and 1z, arranged corresponding to three axes X, Y and Z orthogonal to each other, are irradiated with laser lights from lasers 5x, 5y and 5z at electric field measuring apparatus parts 20x, 20y and 20z via polarization detecting optical systems 7x, 7y and 7z, light bias controllers 9x, 9y and 9z and optical fibers 19x, 19y and 19z for converting changes in the polarization of the laser lights corresponding to the three axes from which the laser lights are reflected to changes in the intensity of the laser lights by the polarization detecting optical systems 7x, 7y and 7z and further to detection signals of changes in the intensity of electrical signals by photodetectors 11x, 11y and 11z. Thus, the intensity and the phase of the detection signals corresponding to the respective axes are shown on a display device 17, being divided into the three axis components.
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