发明名称 FORMATION METHOD OF SILICON-BASED THIN FILM, SILICON-BASED THIN FILM, AND PHOTOVOLTAIC ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide a method for forming a silicon thin film having excellent photoelectric characteristics at film formation speed that is at a practical use level industrially, the silicon thin film, and a photovoltaic element. SOLUTION: In the frequency plasma CVD method using a gas containing halogenated silicon and hydrogen, when high-frequency power P0 (W), high-frequency introduction part area S (cm2), distance (d) (cm) between the high-frequency introduction part and a substrate, and pressure PR (mToor) are expressed by Q=P0×PR/S/d, the value of the W should be set to 50 or more.
申请公布号 JP2001345273(A) 申请公布日期 2001.12.14
申请号 JP20000162805 申请日期 2000.05.31
申请人 CANON INC 发明人 KONDO TAKAHARU;MATSUDA KOICHI;TOKAWA MAKOTO
分类号 C23C16/24;C23C16/509;C30B25/10;H01L21/205;H01L31/0376;H01L31/04;H01L31/18;H01L31/20 主分类号 C23C16/24
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