发明名称 A DYNAMIC-TYPE SEMICONDUCTOR MEMORY DEVICE
摘要 MOS transistors are formed on island-shaped divided element regions of a silicon substrate, and provided with gate electrodes having the same widths as the element regions. Thereafter, capacitor grooves are formed at end portions of the element regions, and capacitor insulating films formed of BSTO are provided on inner walls of the capacitor grooves. Then, the capacitor grooves are filled with storage electrodes, thereby forming capacitors. Furthermore, connection conductors are formed to connect the storage electrodes and source diffusion layers of the MOS transistors. Then, word lines are formed to connect the gate electrodes of the MOS transistors, and further bit lines are formed to connect drain diffusion layers of the MOS transistors.
申请公布号 US2001050388(A1) 申请公布日期 2001.12.13
申请号 US19980203383 申请日期 1998.12.02
申请人 HAMAMOTO TAKESHI 发明人 HAMAMOTO TAKESHI
分类号 H01L21/8242;H01L21/8246;H01L27/105;H01L27/108;H01L29/94;(IPC1-7):H01L29/76;H01L31/119 主分类号 H01L21/8242
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