发明名称 Charged-particle-beam optical systems including beam tube exhibiting reduced eddy currents
摘要 Charged-particle-beam (CPB) optical systems are disclosed that exhibit reduced eddy currents forming in the beam tube of the system. The eddy currents otherwise would degrade beam-control response time of the system. In an embodiment, the beam tube defines at least one slit in an "eddy-current zone" of the beam tube adjacent an energizable coil of the system, such as a deflector coil. The slit(s) is situated so as to divide the eddy-current zone. The slit(s) extends at least part way through the thickness dimension of the beam tube and can be formed using conventional machine tools, wire cutting, or electrical-discharge machining, or other suitable technique. Compared to an eddy-current zone lacking a slit, the divided eddy-current zones produced by the slit(s) have substantially reduced overall area, thereby reducing eddy current in the beam tube and allowing a corresponding increase in beam-control speed.
申请公布号 US2001051317(A1) 申请公布日期 2001.12.13
申请号 US20010875330 申请日期 2001.06.05
申请人 NIKON CORPORATION 发明人 NAKANO KATSUSHI
分类号 G03F7/20;H01J37/09;H01J37/16;H01L21/027;(IPC1-7):G03C5/00;A61N5/00;G21G5/00 主分类号 G03F7/20
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