发明名称 Power supply amperometry unit for semiconductor examination system, includes integrator to integrate output signal of voltage amplifier, whose output signal is converted into digital signal, after predetermined time
摘要 A D/A converter (71) outputs analog voltage signal corresponding to input digital signal. Current output from D/A converter is input to power supply pin of the test device through an operational amplifier (72) and voltage amplifier. An integrator (83) integrates the output signal of voltage amplifier for a preset time. An A/D converter (85) converts the output signal of integrated circuit into digital signal, after specific time. An Independent claim is also included for semiconductor test system.
申请公布号 DE10114001(A1) 申请公布日期 2001.12.13
申请号 DE20011014001 申请日期 2001.03.22
申请人 ADVANTEST CORP., TOKIO/TOKYO 发明人 SUGAMORI, SHIGERU
分类号 G01R31/26;G01R31/28;G01R31/30;G01R31/3183;G01R31/319;(IPC1-7):G01R31/318 主分类号 G01R31/26
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