发明名称 |
Power supply amperometry unit for semiconductor examination system, includes integrator to integrate output signal of voltage amplifier, whose output signal is converted into digital signal, after predetermined time |
摘要 |
A D/A converter (71) outputs analog voltage signal corresponding to input digital signal. Current output from D/A converter is input to power supply pin of the test device through an operational amplifier (72) and voltage amplifier. An integrator (83) integrates the output signal of voltage amplifier for a preset time. An A/D converter (85) converts the output signal of integrated circuit into digital signal, after specific time. An Independent claim is also included for semiconductor test system.
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申请公布号 |
DE10114001(A1) |
申请公布日期 |
2001.12.13 |
申请号 |
DE20011014001 |
申请日期 |
2001.03.22 |
申请人 |
ADVANTEST CORP., TOKIO/TOKYO |
发明人 |
SUGAMORI, SHIGERU |
分类号 |
G01R31/26;G01R31/28;G01R31/30;G01R31/3183;G01R31/319;(IPC1-7):G01R31/318 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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