APPARATUS AND METHOD FOR INSPECTING AND TESTING CHIP DESIGN,申请号KR20000042575-传众专利搜索

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发明名称	APPARATUS AND METHOD FOR INSPECTING AND TESTING CHIP DESIGN
摘要
申请公布号	KR20010110048(A)	申请公布日期	2001.12.12
申请号	KR20000042575	申请日期	2000.07.25
申请人	PARK, HYUN JU;PARK, HYUN SUK	发明人	PARK, HYUN JU;PARK, HYUN SUK
分类号	(IPC1-7):H01L21/66	主分类号	(IPC1-7):H01L21/66
代理机构		代理人
主权项
地址

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