发明名称 |
Semiconductor memory device having write data line |
摘要 |
A write control circuit of a DRAM core cell includes a sense amplifier and first to third N channel MOS transistors. The first and third MOS transistors constitute a column selection gate. If data "1" is written, a write mask signal and a data line are set at L level to render the second MOS transistor nonconductive. If data "0" is written, the write mask signal and the data line are set respectively at L and H levels to render the second MOS transistor conductive. In order to inhibit data rewriting, the write mask signal and the data line are both set at H level to render the second and third transistors nonconductive. Layout area and power consumption can be reduced compared with the conventional approach which requires two data lines.
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申请公布号 |
US6330202(B1) |
申请公布日期 |
2001.12.11 |
申请号 |
US20000706695 |
申请日期 |
2000.11.07 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA;MITSUBISHI ELECTRIC ENGINEERING COMPANY LIMITED |
发明人 |
TANIZAKI HIROAKI;OOISHI TSUKASA |
分类号 |
G11C11/409;G11C7/10;(IPC1-7):G11C7/00 |
主分类号 |
G11C11/409 |
代理机构 |
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