发明名称 Method of producing semiconductor device
摘要 For forming electrical interlayer contact in a semiconductor device, an insulating film is formed on a first electrically conductive layer and then a contact hole is formed in the insulating film to expose a part of the first electroconductive, an activated surface of the exposed part is formed in the contact hole, a gas containing an impurity component is supplied to form an impurity adsorption film on the activated surface, and the contact hole is filled with a second electrically conductive layer which electrically contacts the first layer through the contact hole.
申请公布号 US6329274(B1) 申请公布日期 2001.12.11
申请号 US19920995325 申请日期 1992.12.28
申请人 SEIKO INSTRUMENTS INC. 发明人 INOUE NAOTO;AOKI KENJI;HOSAKA TAKASHI
分类号 H01L21/225;H01L21/285;H01L21/60;H01L21/768;(IPC1-7):H01L21/28 主分类号 H01L21/225
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