| 摘要 |
A semiconductor device has an oscillator for generating an oscillating signal whose frequency is dependent on temperature, a frequency tester for determining whether or not the frequency of the oscillating signal is normal, a heater for generating heat if the frequency tester determines that the frequency is abnormal, and a first hard macro core that is shifted to a normal operation mode if the frequency tester determines that the frequency is normal. The oscillator, heater, and first hard macro core are put under the same temperature condition. The frequency tester employs a lower limit of an operating temperature range of the first hard macro core as a reference to determine whether or not the frequency of the oscillating signal is normal.
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