| 摘要 |
<p>PROBLEM TO BE SOLVED: To solve the disadvantage of conventional X-ray stress measuring methods that a change of angleψoften varies the penetrating depth of X-ray to cause the measurement of the stress in a different depth. SOLUTION: This X-ray stress measuring method comprises injecting the X-ray from an X-ray source 2 to a measuring subject 1 at a prescribed angle, detecting the X-ray diffracted by the measuring subject 1 by an X-ray detector 3, and measuring the internal stress on the basis of the detected value. In this method, when the X-ray from the X-ray source is injected to an optional position of the measuring subject at a set angle to the measuring subject surface, and the measuring subject is rotated around anω-axis right-angled to the incident X-ray r1 on the surface of the measuring subject 1 surface and anχ-axis conformed to the incident X-ray r1 when rotating theω-axis, the angleψformed by the normal N of a diffraction surface and the normal L of the measuring subject surface is changed while rotating the measuring subject so that the angle formed by the measuring subject surface 1 and the incident X-ray r1 on the plane passing an X-ray emitting point P, the incident X-ray r1 and a diffracted X-ray r2 is constant to measure the diffraction line.</p> |
