| 摘要 |
PROBLEM TO BE SOLVED: To provide a waveform-measuring apparatus having high responsiveness in an EXP average mode. SOLUTION: The waveform-measuring apparatus performs at least sampling of waveform data, an averaging operation including an exponential function averaging process mode for the waveform data sampled, and renewing of data displayed on a display, according to the result of the averaging operation, all of these under control of a sequence controller. The sequence controller is provided with a timer, and when the exponential function averaging process mode is selected, sampling of the waveform data and the exponential function averaging operation are repeated within a prescribed period of time set by the timer, regardless of the rate updating of the data displayed on the display.
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