发明名称 Method for processing reflection seismic traces recorded for variable offsets
摘要 PCT No. PCT/FR96/01536 Sec. 371 Date Aug. 11, 1997 Sec. 102(e) Date Aug. 11, 1997 PCT Filed Oct. 2, 1996 PCT Pub. No. WO97/14062 PCT Pub. Date Apr. 17, 1997A method of processing reflection seismic traces based on a D(tau, x2) diagram showing horizontal events (WAH-WDH). For each value of tau the corresponding signal amplitude is analyzed for the various x2 in a time window of less than a predetermined width. The amplitudes are subjected to conventional linear regression minimizing the sum of absolute values of discrepancies from the straight line, or the sum of their squares. Each concentration zone is swept by a straight line pivoting successively about each point with a slope equal to the square of the offset.
申请公布号 OA10423(A) 申请公布日期 2001.12.07
申请号 OA19970070016 申请日期 1997.05.30
申请人 发明人
分类号 G01V1/32;G01V1/36;(IPC1-7):G01V1/36;G01V1/30 主分类号 G01V1/32
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